ºÚÁϳԹÏÍø

Data Reduction Guide – UnderstandingÌý EPMA Analytical Results

• The goal of data reduction
• The ZAF Model for Correction of Matrix Effects Upon Measured X-ray Intensities
• Accuracy and Precision
• Categorization of the types of errors affecting accuracy and precision
• Systematic ErrorsÌý
• Physical Standard and sample errors
• Procedural errors
• Counting statistics
• Probe for EPMA
• References

Ìý

(PDF - 1.3 MB)

Services Offered

The ºÚÁϳԹÏÍøEPMA offers several services to our valued clients, as follows:

• State-of-the-art quantitative and qualitative analysis using both onboard JEOL software and external Probe for EPMA (PfE)â„¢ software provided by ProbeSoftware Inc.
• High-resolution, X-ray compositional mapping using the JEOL software package
• High-resolution electron-imaging in secondary, back-scattered and topographic mode; low-resolution cathodoluminescence imaging
• Training on both the JEOL and Probe for EPMA (PfE)â„¢ software packages
• Remote data analysis via Probe for EPMA (PfE)â„¢ software, downloaded directly from the ProbeSoftware Inc. website
• Thin section preparation coordinated through Dalhousie’s Thin Section Lab
• Carbon-coating of samples to be imaged or analysed using the microprobe
• In Development* – Remote usage of the JXA-8200 with online, live-time technical training and supportÌýÌýÌýÌý
• In Development*Ìý– Remote teaching – the ability of educators to use the microprobe for teaching purposes, especially important to schools that don’t have an on-site microprobe of their own
• In Development*Ìý– Remote, live-time, conferenced demonstrations for corporate and other business clients – e.g., the ability of corporate clients to show investment potential to stakeholders

ÌýÌýÌýÌýÌýÌýÌýÌýÌýÌýÌýÌýÌýÌýÌýÌýÌýÌý *Ìý Please contact Dan MacDonald if you are interested in testing these applications

Ìý

Ìý